000 00525nam a2200193Ia 4500
008 230209s9999 xx 000 0 und d
022 _a2375-1053
041 _aeng
245 _aVLSI Test Symposium
260 _bIEEE
500 _aConference
650 _aCircuits
650 _aCommunication
650 _aComponents
650 _aComputing and Processing
650 _aDevices and Systems
650 _aNetworking and Broadcast Technologies
856 _uhttps://ieeexplore.ieee.org/servlet/opac?punumber=1000804
999 _c45865
_d45865