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| 245 | _aNorth Atlantic Test Workshop (NATW), IEEE | ||
| 260 | _bIEEE | ||
| 500 | _aConference | ||
| 650 | _aCircuits | ||
| 650 | _aComponents | ||
| 650 | _aComputing and Processing | ||
| 650 | _aDevices and Systems | ||
| 650 | _aEngineering Profession | ||
| 856 | _uhttps://ieeexplore.ieee.org/servlet/opac?punumber=1803907 | ||
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