000 00466nam a2200145Ia 4500
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041 _aeng
245 _aArtificial Intelligence Testing (AITest), IEEE International Conference On
260 _bIEEE
500 _aConference
650 _aComputing and Processing
650 _aEngineering Profession
650 _aGeneral Topics for Engineers
856 _uhttps://ieeexplore.ieee.org/servlet/opac?punumber=1831724
999 _c42581
_d42581