000 00589nam a2200181Ia 4500
008 230209s2022 xx 000 0 und d
022 _a978-1-6654-8737-5
022 _a978-1-6654-8738-2
041 _aeng
245 _a2022 IEEE International Conference On Artificial Intelligence Testing (AITest)
260 _bIEEE
_c2022
500 _aProceeding
650 _aComputing and Processing
650 _aEngineering Profession
650 _aGeneral Topics for Engineers
650 _aRobotics and Control Systems
856 _uhttps://ieeexplore.ieee.org/servlet/opac?punumber=9897095
999 _c41628
_d41628