000 00634nam a2200217Ia 4500
008 230209s2019 xx 000 0 und d
022 _a978-1-7281-1756-0
022 _a978-1-7281-1757-7
041 _aeng
245 _a2019 IEEE Latin American Test Symposium (LATS)
260 _bIEEE
_c2019
500 _aProceeding
650 _aAerospace
650 _aCircuits
650 _aComponents
650 _aComputing and Processing
650 _aDevices and Systems
650 _aRobotics and Control Systems
650 _aSignal Processing and Analysis
856 _uhttps://ieeexplore.ieee.org/servlet/opac?punumber=8700506
999 _c36634
_d36634