000 00640nam a2200193Ia 4500
008 230209s2019 xx 000 0 und d
022 _a978-1-7281-4331-6
022 _a978-1-7281-4332-3
041 _aeng
245 _a2019 IEEE 4th International Conference on Condition Assessment Techniques in Electrical Systems (CATCON)
260 _bIEEE
_c2019
500 _aProceeding
650 _aDielectrics and Plasmas
650 _aEnergy and Industry Applications
650 _aEngineered Materials
650 _aPower
650 _aSignal Processing and Analysis
856 _uhttps://ieeexplore.ieee.org/servlet/opac?punumber=9070054
999 _c36254
_d36254