000 00469nam a2200169Ia 4500
008 230209s2019 xx 000 0 und d
022 _a978-1-7281-1170-4
022 _a978-1-7281-1171-1
041 _aeng
245 _a2019 IEEE 37th VLSI Test Symposium (VTS)
260 _bIEEE
_c2019
500 _aProceeding
650 _aCircuits
650 _aComponents
650 _aDevices and Systems
856 _uhttps://ieeexplore.ieee.org/servlet/opac?punumber=8753115
999 _c36230
_d36230