000 00520nam a2200169Ia 4500
008 230209s2019 xx 000 0 und d
022 _a978-1-7281-9129-4
022 _a978-1-7355325-0-9
041 _aeng
245 _a2019 35th Semiconductor Thermal Measurement, Modeling and Management Symposium (SEMI-THERM)
260 _bIEEE
_c2019
500 _aProceeding
650 _aCircuits
650 _aComponents
650 _aDevices and Systems
856 _uhttps://ieeexplore.ieee.org/servlet/opac?punumber=9162002
999 _c35750
_d35750