000 00544nam a2200169Ia 4500
008 230209s2021 xx 000 0 und d
022 _a978-1-6654-3481-2
022 _a978-1-6654-3482-9
041 _aeng
245 _a2021 IEEE International Conference on Artificial Intelligence Testing (AITest)
260 _bIEEE
_c2021
500 _aProceeding
650 _aComputing and Processing
650 _aEngineering Profession
650 _aRobotics and Control Systems
856 _uhttps://ieeexplore.ieee.org/servlet/opac?punumber=9564290
999 _c25931
_d25931