000 00544nam a2200169Ia 4500
008 230209s2019 xx 000 0 und d
022 _a978-1-7281-0492-8
022 _a978-1-7281-0493-5
041 _aeng
245 _a2019 IEEE International Conference On Artificial Intelligence Testing (AITest)
260 _bIEEE
_c2019
500 _aProceeding
650 _aComputing and Processing
650 _aEngineering Profession
650 _aGeneral Topics for Engineers
856 _uhttps://ieeexplore.ieee.org/servlet/opac?punumber=8716376
999 _c22408
_d22408