| 000 | 00603nam a2200205Ia 4500 | ||
|---|---|---|---|
| 008 | 230209s2018 xx 000 0 und d | ||
| 022 | _a978-1-5386-6400-1 | ||
| 022 | _a978-1-5386-6401-8 | ||
| 041 | _aeng | ||
| 245 | _a2018 IEEE 27th North Atlantic Test Workshop (NATW) | ||
| 260 |
_bIEEE _c2018 |
||
| 500 | _aProceeding | ||
| 650 | _aCircuits | ||
| 650 | _aComponents | ||
| 650 | _aComputing and Processing | ||
| 650 | _aDevices and Systems | ||
| 650 | _aEngineering Profession | ||
| 650 | _aPhotonics and Electrooptics | ||
| 856 | _uhttps://ieeexplore.ieee.org/servlet/opac?punumber=8379736 | ||
| 999 |
_c20328 _d20328 |
||