000 00594nam a2200205Ia 4500
008 230209s2017 xx 000 0 und d
022 _a978-1-5090-4482-5
022 _a978-1-5090-4483-2
041 _aeng
245 _a2017 IEEE 35th VLSI Test Symposium (VTS)
260 _bIEEE
_c2017
500 _aProceeding
650 _aCircuits
650 _aCommunication
650 _aComponents
650 _aComputing and Processing
650 _aDevices and Systems
650 _aNetworking and Broadcast Technologies
856 _uhttps://ieeexplore.ieee.org/servlet/opac?punumber=7921795
999 _c18596
_d18596