| 000 | 00412nam a2200145Ia 4500 | ||
|---|---|---|---|
| 008 | 230120s1985 xx 000 0 und d | ||
| 020 | _a9780262256186 | ||
| 041 | _aeng | ||
| 100 | _aFujiwara | ||
| 245 | _aLogic Testing and Design for Testability | ||
| 260 |
_bMIT Press _c1985 |
||
| 300 | _bfulltext | ||
| 650 | _aComputing and Processing | ||
| 856 | _uhttps://ieeexplore.ieee.org/servlet/opac?bknumber=6267264 | ||
| 999 |
_c13468 _d13468 |
||