000 00463nam a2200169Ia 4500
008 230120s2010 xx 000 0 und d
020 _a9780470597200
020 _a9780470606827
041 _aeng
100 _aAbran
245 _aSoftware Metrics and Software Metrology
250 _a1
260 _bWiley-IEEE Press
_c2010
300 _bfulltext
650 _aComputing and Processing
856 _uhttps://ieeexplore.ieee.org/servlet/opac?bknumber=6381791
999 _c12813
_d12813