| 000 | 00514nam a2200181Ia 4500 | ||
|---|---|---|---|
| 008 | 230120s2009 xx 000 0 und d | ||
| 020 | _a9780470455258 | ||
| 020 | _a9780471731726 | ||
| 041 | _aeng | ||
| 100 | _aStrong | ||
| 245 | _aReliability Wearout Mechanisms in Advanced CMOS Technologies | ||
| 260 |
_bWiley-IEEE Press _c2009 |
||
| 300 | _bfulltext | ||
| 650 | _aCircuits | ||
| 650 | _aDevices and Systems | ||
| 650 | _aComponents | ||
| 856 | _uhttps://ieeexplore.ieee.org/servlet/opac?bknumber=5361029 | ||
| 999 |
_c12733 _d12733 |
||