000 00501nam a2200181Ia 4500
008 230120s1990 xx 000 0 und d
020 _a9780470544389
020 _a9780780310629
041 _aeng
100 _aAbramovici
245 _aDigital Systems Testing and Testable Design
260 _bWiley-IEEE Press
_c1990
300 _bfulltext
650 _aCircuits
650 _aDevices and Systems
650 _aComponents
856 _uhttps://ieeexplore.ieee.org/servlet/opac?bknumber=5266057
999 _c12089
_d12089