TY  - BOOK
AU  - Garg
TI  - Addressing Process Variations At the Microarchitecture and System Level
SN  - 9781601986597
PY  - 2013///
PB  - Now Foundations and Trends
KW  - Components, Circuits, Devices and Systems; Engineered Materials, Dielectrics and Plasmas; Power, Energy and Industry Applications
UR  - https://ieeexplore.ieee.org/servlet/opac?bknumber=8187380
ER  -