Wang, Laung-Terng; Cheng-Wen Wu; Wen, Xiaoqing <br/><br/>
VLSI Test Principles and Architectures: Design for Testability 

 - London  ELSEVIER  2006 
 - 777p 
<br/><br/><label>ISBN: </label>9780123705976 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrical
<br/><br/><label>Dewey Class. No.: </label>621.39 WAN