2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) 

 -  IEEE  2020 
<br/><br/> Proceeding 
<br/><br/><label>ISSN: </label>978-1-7281-6083-2 978-1-7281-6084-9 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Circuits<br/>Communication<br/>Components<br/>Computing and Processing<br/>Devices and Systems<br/>Energy and Industry Applications<br/>Networking and Broadcast Technologies<br/>Power<br/>Robotics and Control Systems<br/>Signal Processing and Analysis