2019 IEEE 28th Asian Test Symposium (ATS) 

 -  IEEE  2019 
<br/><br/> Proceeding 
<br/><br/><label>ISSN: </label>978-1-7281-2695-1 978-1-7281-2696-8 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Circuits<br/>Components<br/>Computing and Processing<br/>Devices and Systems