2019 35th Semiconductor Thermal Measurement, Modeling and Management Symposium (SEMI-THERM) 

 -  IEEE  2019 
<br/><br/> Proceeding 
<br/><br/><label>ISSN: </label>978-1-7281-9129-4 978-1-7355325-0-9 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Circuits<br/>Components<br/>Devices and Systems