2017 IEEE 35th VLSI Test Symposium (VTS) 

 -  IEEE  2017 
<br/><br/> Proceeding 
<br/><br/><label>ISSN: </label>978-1-5090-4482-5 978-1-5090-4483-2 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Circuits<br/>Communication<br/>Components<br/>Computing and Processing<br/>Devices and Systems<br/>Networking and Broadcast Technologies