2017 IEEE 26th Asian Test Symposium (ATS) 

 -  IEEE  2017 
<br/><br/> Proceeding 
<br/><br/><label>ISSN: </label>978-1-5386-2437-1 978-1-5386-3516-2 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Circuits<br/>Communication<br/>Components<br/>Computing and Processing<br/>Devices and Systems<br/>Networking and Broadcast Technologies<br/>Nuclear Engineering