2020 IEEE International Conference On Artificial Intelligence Testing (AITest) 

 -  IEEE  2020 
<br/><br/> Proceeding 
<br/><br/><label>ISSN: </label>978-1-7281-6984-2 978-1-7281-6985-9 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computing and Processing<br/>Engineering Profession<br/>General Topics for Engineers