2019 IEEE/ACM 4th International Workshop on Metamorphic Testing (MET) 

 -  IEEE  2019 
<br/><br/> Proceeding 
<br/><br/><label>ISSN: </label>978-1-7281-2235-9 978-1-7281-2236-6 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computing and Processing