2017 International Conference of the Biometrics Special Interest Group (BIOSIG) 

 -  IEEE  2017 
<br/><br/> Proceeding 
<br/><br/><label>ISSN: </label>978-1-5386-0396-3 978-3-88579-664-0 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computing and Processing<br/>Engineering Profession<br/>Photonics and Electrooptics