Abramovici, Miron ; Breuer, Melvin A. ; Friedman, Arthur D. <br/><br/>
Digital Systems Testing and Testable Design 

 - New York  IEEE Press  1990 
 - 659 
<br/><br/><label>ISBN: </label>0780310624 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronics