TY  - BOOK
AU  - Strong
TI  - Reliability Wearout Mechanisms in Advanced CMOS Technologies
SN  - 9780470455258
PY  - 2009///
PB  - Wiley-IEEE Press
KW  - Circuits
KW  - Devices and Systems
KW  - Components
UR  - https://ieeexplore.ieee.org/servlet/opac?bknumber=5361029
ER  -