Strong <br/><br/>
Reliability Wearout Mechanisms in Advanced CMOS Technologies 

 -  Wiley-IEEE Press  2009 
 -  fulltext 
<br/><br/><label>ISBN: </label>9780470455258 9780471731726 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Circuits<br/>Devices and Systems<br/>Components