VLSI Test Principles and Architectures: Design for Testability

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Material type: Text

TextPublication details: London ELSEVIER 2006Description: 777pISBN:

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Reference	School of Engineering Electronics	Under Graduation	621.39 WAN (Browse shelf(Opens below))	Available		SE21120
Circulation	School of Engineering Electronics	Under Graduation	621.39 WAN (Browse shelf(Opens below))	Checked out	31/07/2025	SE21121

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Previous	621.39 SHE Algorithms for VLSI physical design automation	621.39 SHE Algorithms for VLSI physical design automation	621.39 WAN VLSI Test Principles and Architectures: Design for Testability	621.39 WAN VLSI Test Principles and Architectures: Design for Testability	621.3916 YIU The Definitive Guide to ARM CORTEX M3 and CORTEX M4 Processor	621.392 MAN Digital design : with a introduction to the Verilog HDL	621.392 MAN Digital design : with a introduction to the Verilog HDL	Next

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