ONLINE PUBLIC ACCESS CATALOG(OPAC)

Amazon cover image
Image from Amazon.com

IEEE standard for information technology : test methods for measuring conformance to POSIX Par-1

By: Material type: TextTextLanguage: ENG Publication details: New York New York Institute of Electrical and Electronics Engineers, Inc 1993Description: 442ISBN:
  • 1559372753
Subject(s): DDC classification:
  • 005.430218 IEE
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Collection Call number Status Notes Date due Barcode
Reference Reference School of Engineering Computer Science Under Graduation 005.430218 IEE (Browse shelf(Opens below)) Available RACK NO: CS302R, SHELF_NO: 53 SE8867

There are no comments on this title.

to post a comment.

Powered by Koha