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Reliability Wearout Mechanisms in Advanced CMOS Technologies

By: Material type: TextTextLanguage: English Publication details: Wiley-IEEE Press 2009Description: fulltextISBN:
  • 9780470455258
  • 9780471731726
Subject(s): Online resources:
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Item type Current library Call number Status Date due Barcode
IEEE-Wiley eBooks Library IEEE-Wiley eBooks Library School of Engineering Available 5361029

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