ONLINE PUBLIC ACCESS CATALOG(OPAC)

2019 35th Semiconductor Thermal Measurement, Modeling and Management Symposium (SEMI-THERM) (Record no. 35750)

MARC details
000 -LEADER
fixed length control field 00520nam a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230209s2019 xx 000 0 und d
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 978-1-7281-9129-4
022 ## - INTERNATIONAL STANDARD SERIAL NUMBER
International Standard Serial Number 978-1-7355325-0-9
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
245 ## - TITLE STATEMENT
Title 2019 35th Semiconductor Thermal Measurement, Modeling and Management Symposium (SEMI-THERM)
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. IEEE
Date of publication, distribution, etc. 2019
500 ## - GENERAL NOTE
General note Proceeding
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Circuits
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Components
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Devices and Systems
856 ## - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://ieeexplore.ieee.org/servlet/opac?punumber=9162002">https://ieeexplore.ieee.org/servlet/opac?punumber=9162002</a>

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