IEEE standard techniques for high-voltage testing (Record no. 1682)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00565nam a2200181Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 211226b1978 xxu||||| |||| 00| 0 eng d |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | ENG |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0471049913 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.374 IEE |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | IEEE |
| 245 ## - TITLE STATEMENT | |
| Title | IEEE standard techniques for high-voltage testing |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | New York |
| Name of publisher, distributor, etc. | Institute of Electrical and Electronics Engineers Inc |
| Date of publication, distribution, etc. | 1978 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 125 |
| 909 ## - | |
| -- | SE8824 (Reference) |
| 906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) | |
| a | 13043 |
| 907 ## - LOCAL DATA ELEMENT G, LDG (RLIN) | |
| a | School of Engineering |
| 909 ## - | |
| -- | Item StatusAdd IdLocationItem CategorySE8824ReferenceElectronics (EL)REFERENCE' |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection | Home library | Current library | Shelving location | Date acquired | Cost, normal purchase price | Total Checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type | Public note |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Under Graduation | School of Engineering | School of Engineering | Electronics | 21/02/2018 | 0.00 | 621.374 IEE | SE8824 | 11/12/2022 | 11/12/2022 | Reference | RACK NO: EC202R, SHELF_NO: 75 |